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Journal: Electronics, 2025
Volume: 14
Number: 2176

Article: Analysis of the SEU Tolerance of an FPGA-Based Time-to-Digital Converter Using Emulation-Based Fault Injection
Authors: by Roza Teklehaimanot Siecha, Getachew Alemu, Jeffrey Prinzie and Paul Leroux
Link: https://www.mdpi.com/2079-9292/14/11/2176

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