Next Article in Journal
Efficient Steel Surface Defect Detection via a Lightweight YOLO Framework with Task-Specific Knowledge-Guided Optimization
Previous Article in Journal
A 0.6 V 68.2 dB 0.42 µW SAR-ΣΔ ADC for ASIC Chip in 0.18 µm CMOS
 
 
Article

Article Versions Notes

Electronics 2025, 14(10), 2033; https://doi.org/10.3390/electronics14102033
Action Date Notes Link
article xml file uploaded 16 May 2025 12:16 CEST Original file -
article xml uploaded. 16 May 2025 12:17 CEST Update https://www.mdpi.com/2079-9292/14/10/2033/xml
article pdf uploaded. 16 May 2025 12:17 CEST Version of Record https://www.mdpi.com/2079-9292/14/10/2033/pdf
article html file updated 16 May 2025 12:19 CEST Original file https://www.mdpi.com/2079-9292/14/10/2033/html
Back to TopTop