Byun, S.-J.; Seo, J.-T.; Kim, T.-H.; Lee, J.-H.; Kim, Y.-K.; Baek, K.-H.
An 11-Bit Single-Slope/Successive Approximation Register Analog-to-Digital Converters with On-Chip Fine Step Range Calibration for CMOS Image Sensors. Electronics 2025, 14, 83.
https://doi.org/10.3390/electronics14010083
AMA Style
Byun S-J, Seo J-T, Kim T-H, Lee J-H, Kim Y-K, Baek K-H.
An 11-Bit Single-Slope/Successive Approximation Register Analog-to-Digital Converters with On-Chip Fine Step Range Calibration for CMOS Image Sensors. Electronics. 2025; 14(1):83.
https://doi.org/10.3390/electronics14010083
Chicago/Turabian Style
Byun, Seong-Jun, Jee-Taeck Seo, Tae-Hyun Kim, Jeong-Hun Lee, Young-Kyu Kim, and Kwang-Hyun Baek.
2025. "An 11-Bit Single-Slope/Successive Approximation Register Analog-to-Digital Converters with On-Chip Fine Step Range Calibration for CMOS Image Sensors" Electronics 14, no. 1: 83.
https://doi.org/10.3390/electronics14010083
APA Style
Byun, S.-J., Seo, J.-T., Kim, T.-H., Lee, J.-H., Kim, Y.-K., & Baek, K.-H.
(2025). An 11-Bit Single-Slope/Successive Approximation Register Analog-to-Digital Converters with On-Chip Fine Step Range Calibration for CMOS Image Sensors. Electronics, 14(1), 83.
https://doi.org/10.3390/electronics14010083