Halchenko, V.Y.; Trembovetska, R.; Tychkov, V.; Kovtun, V.; Tychkova, N.
Application of Reduced Order Surrogate Models in Compatible Determination of Material Properties Profiles by Eddy Current Method. Electronics 2025, 14, 212.
https://doi.org/10.3390/electronics14010212
AMA Style
Halchenko VY, Trembovetska R, Tychkov V, Kovtun V, Tychkova N.
Application of Reduced Order Surrogate Models in Compatible Determination of Material Properties Profiles by Eddy Current Method. Electronics. 2025; 14(1):212.
https://doi.org/10.3390/electronics14010212
Chicago/Turabian Style
Halchenko, Volodymyr Y., Ruslana Trembovetska, Volodymyr Tychkov, Viacheslav Kovtun, and Nataliia Tychkova.
2025. "Application of Reduced Order Surrogate Models in Compatible Determination of Material Properties Profiles by Eddy Current Method" Electronics 14, no. 1: 212.
https://doi.org/10.3390/electronics14010212
APA Style
Halchenko, V. Y., Trembovetska, R., Tychkov, V., Kovtun, V., & Tychkova, N.
(2025). Application of Reduced Order Surrogate Models in Compatible Determination of Material Properties Profiles by Eddy Current Method. Electronics, 14(1), 212.
https://doi.org/10.3390/electronics14010212