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Journal: Electronics, 2024
Volume: 13
Number: 1384

Article: Advanced Anomaly Detection in Manufacturing Processes: Leveraging Feature Value Analysis for Normalizing Anomalous Data
Authors: by Seunghyun Kim, Hyunsoo Seo and Eui Chul Lee
Link: https://www.mdpi.com/2079-9292/13/7/1384

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