Next Article in Journal
Comparison Analysis of Radiation Effects on 1.2 kV SiC Metal-Oxide-Semiconductor Field-Effect Transistors with Gamma-Ray and Proton Irradiation
Previous Article in Journal
Usability Analysis of a Virtual Reality Exposure Therapy Serious Game for Blood Phobia Treatment: Phobos
Previous Article in Special Issue
Design Space of GaN Vertical Trench Junction Barrier Schottky Diodes: Comprehensive Study and Analytical Modeling
 
 
Communication

Article Versions Notes

Electronics 2024, 13(7), 1351; https://doi.org/10.3390/electronics13071351
Action Date Notes Link
article xml file uploaded 3 April 2024 13:41 CEST Original file -
article xml uploaded. 3 April 2024 13:41 CEST Update https://www.mdpi.com/2079-9292/13/7/1351/xml
article pdf uploaded. 3 April 2024 13:41 CEST Version of Record https://www.mdpi.com/2079-9292/13/7/1351/pdf
article html file updated 3 April 2024 13:43 CEST Original file https://www.mdpi.com/2079-9292/13/7/1351/html
Back to TopTop