Kaniuka, J.; Ostrysz, J.; Groszyk, M.; Bieniek, K.; Cyperski, S.; Domański, P.D.
Multicriteria Machine Learning Model Assessment—Residuum Analysis Review. Electronics 2024, 13, 810.
https://doi.org/10.3390/electronics13050810
AMA Style
Kaniuka J, Ostrysz J, Groszyk M, Bieniek K, Cyperski S, Domański PD.
Multicriteria Machine Learning Model Assessment—Residuum Analysis Review. Electronics. 2024; 13(5):810.
https://doi.org/10.3390/electronics13050810
Chicago/Turabian Style
Kaniuka, Jan, Jakub Ostrysz, Maciej Groszyk, Krzysztof Bieniek, Szymon Cyperski, and Paweł D. Domański.
2024. "Multicriteria Machine Learning Model Assessment—Residuum Analysis Review" Electronics 13, no. 5: 810.
https://doi.org/10.3390/electronics13050810
APA Style
Kaniuka, J., Ostrysz, J., Groszyk, M., Bieniek, K., Cyperski, S., & Domański, P. D.
(2024). Multicriteria Machine Learning Model Assessment—Residuum Analysis Review. Electronics, 13(5), 810.
https://doi.org/10.3390/electronics13050810