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Journal: Electronics, 2024
Volume: 13
Number: 3618

Article: A MCDM-Based Analysis Method of Testability Allocation for Multi-Functional Integrated RF System
Authors: by Chao Zhang, Yiyang Huang, Dingyu Zhou, Zhijie Dong, Shilie He and Zhenwei Zhou
Link: https://www.mdpi.com/2079-9292/13/18/3618

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