Aroon, N.; Liu, V.; Kane, L.; Li, Y.; Tesfamicael, A.D.; McKague, M.
An Architecture of Enhanced Profiling Assurance for IoT Networks. Electronics 2024, 13, 2832.
https://doi.org/10.3390/electronics13142832
AMA Style
Aroon N, Liu V, Kane L, Li Y, Tesfamicael AD, McKague M.
An Architecture of Enhanced Profiling Assurance for IoT Networks. Electronics. 2024; 13(14):2832.
https://doi.org/10.3390/electronics13142832
Chicago/Turabian Style
Aroon, Nut, Vicky Liu, Luke Kane, Yuefeng Li, Aklilu Daniel Tesfamicael, and Matthew McKague.
2024. "An Architecture of Enhanced Profiling Assurance for IoT Networks" Electronics 13, no. 14: 2832.
https://doi.org/10.3390/electronics13142832
APA Style
Aroon, N., Liu, V., Kane, L., Li, Y., Tesfamicael, A. D., & McKague, M.
(2024). An Architecture of Enhanced Profiling Assurance for IoT Networks. Electronics, 13(14), 2832.
https://doi.org/10.3390/electronics13142832