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Journal: Electronics, 2023
Volume: 12
Number: 1555
Article:
GaN and SiC Device Characterization by a Dedicated Embedded Measurement System
Authors:
by
Alberto Vella, Giuseppe Galioto, Gianpaolo Vitale, Giuseppe Lullo and Giuseppe Costantino Giaconia
Link:
https://www.mdpi.com/2079-9292/12/7/1555
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