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Journal: Electronics, 2023
Volume: 12
Number: 844
Article:
Millimeter-Wave Channel Measurements and Path Loss Characterization in a Typical Indoor Office Environment
Authors:
by
Lorenzo Rubio, Vicent M. Rodrigo Peñarrocha, Marta Cabedo-Fabres, Bernardo Bernardo-Clemente, Juan Reig, Herman Fernández, Jesús R. Pérez, Rafael P. Torres, Luis Valle and Óscar Fernández
Link:
https://www.mdpi.com/2079-9292/12/4/844
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