Ahn, H.;                     Lee, M.;                     Seong, S.;                     Lee, M.;                     Na, G.-J.;                     Chun, I.-G.;                     Kim, Y.;                     Hong, C.-H.    
        BioEdge: Accelerating Object Detection in Bioimages with Edge-Based Distributed Inference. Electronics 2023, 12, 4544.
    https://doi.org/10.3390/electronics12214544
    AMA Style
    
                                Ahn H,                                 Lee M,                                 Seong S,                                 Lee M,                                 Na G-J,                                 Chun I-G,                                 Kim Y,                                 Hong C-H.        
                BioEdge: Accelerating Object Detection in Bioimages with Edge-Based Distributed Inference. Electronics. 2023; 12(21):4544.
        https://doi.org/10.3390/electronics12214544
    
    Chicago/Turabian Style
    
                                Ahn, Hyunho,                                 Munkyu Lee,                                 Sihoon Seong,                                 Minhyeok Lee,                                 Gap-Joo Na,                                 In-Geol Chun,                                 Youngpil Kim,                                 and Cheol-Ho Hong.        
                2023. "BioEdge: Accelerating Object Detection in Bioimages with Edge-Based Distributed Inference" Electronics 12, no. 21: 4544.
        https://doi.org/10.3390/electronics12214544
    
    APA Style
    
                                Ahn, H.,                                 Lee, M.,                                 Seong, S.,                                 Lee, M.,                                 Na, G.-J.,                                 Chun, I.-G.,                                 Kim, Y.,                                 & Hong, C.-H.        
        
        (2023). BioEdge: Accelerating Object Detection in Bioimages with Edge-Based Distributed Inference. Electronics, 12(21), 4544.
        https://doi.org/10.3390/electronics12214544