Next Article in Journal
Recovery Effect of Hot-Carrier Stress on γ-ray-Irradiated 0.13 μm Partially Depleted SOI n-MOSFETs
Next Article in Special Issue
A Study on EMI Noise Countermeasure Design of a Dishwasher
Previous Article in Journal
Research of Islanding Operation and Fault Recovery Strategies of Distribution Network Considering Uncertainty of New Energy
 
 
Due to scheduled maintenance work on our database systems, there may be short service disruptions on this website between 10:00 and 11:00 CEST on June 14th.
Article

Article Versions Notes

Electronics 2023, 12(20), 4231; https://doi.org/10.3390/electronics12204231
Action Date Notes Link
article xml file uploaded 13 October 2023 08:52 CEST Original file -
article xml uploaded. 13 October 2023 08:52 CEST Update -
article pdf uploaded. 13 October 2023 08:52 CEST Version of Record https://www.mdpi.com/2079-9292/12/20/4231/pdf-vor
article html file updated 13 October 2023 08:54 CEST Original file -
article xml file uploaded 18 October 2023 09:01 CEST Update -
article xml uploaded. 18 October 2023 09:01 CEST Update https://www.mdpi.com/2079-9292/12/20/4231/xml
article pdf uploaded. 18 October 2023 09:01 CEST Updated version of record https://www.mdpi.com/2079-9292/12/20/4231/pdf
article html file updated 18 October 2023 09:03 CEST Update https://www.mdpi.com/2079-9292/12/20/4231/html
Back to TopTop