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Journal: Electronics, 2023
Volume: 12
Number: 4181
4181
Article: Analysis of Difference in Areal Density Aluminum Equivalent Method in Ionizing Total Dose Shielding Analysis of Semiconductor Devices
Authors: by Mingyu Liu, Chengfa He, Jie Feng, Mingzhu Xun, Jing Sun, Yudong Li and Qi Guo
Link: https://www.mdpi.com/2079-9292/12/19/4181

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