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Journal: Electronics, 2023
Volume: 12
Number: 3821

Article: A Universal-Verification-Methodology-Based Testbench for the Coverage-Driven Functional Verification of an Instruction Cache Controller
Authors: by Cong Liu, Xinyu Xu, Zhenjiao Chen and Binghao Wang
Link: https://www.mdpi.com/2079-9292/12/18/3821

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