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Journal: Electronics, 2023
Volume: 12
Number: 3518
Article:
Reduction of False Positives for Runtime Errors in C/C++ Software: A Comparative Study
Authors:
by
Jihyun Park, Jaeyoung Shin and Byoungju Choi
Link:
https://www.mdpi.com/2079-9292/12/16/3518
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