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Journal: Electronics, 2023
Volume: 12
Number: 3439

Article: Impact Mechanisms of Commutation Failure Caused by a Sending-End AC Fault and Its Recovery Speed on Transient Stability
Authors: by Yifeng Lin, Jiawei Hu, Tong Wang and Zengping Wang
Link: https://www.mdpi.com/2079-9292/12/16/3439

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