Shu, L.; Liao, H.-L.; Wu, Z.-Y.; Li, Y.-Y.; Fang, X.-Y.; Liang, S.-W.; Li, T.-D.; Wang, L.; Wang, J.; Zhao, Y.-F.
Comparison of Gamma Irradiation Effects on Short Circuit Characteristics of SiC MOSFET Power Devices between Planar and Trench Structures. Electronics 2023, 12, 2891.
https://doi.org/10.3390/electronics12132891
AMA Style
Shu L, Liao H-L, Wu Z-Y, Li Y-Y, Fang X-Y, Liang S-W, Li T-D, Wang L, Wang J, Zhao Y-F.
Comparison of Gamma Irradiation Effects on Short Circuit Characteristics of SiC MOSFET Power Devices between Planar and Trench Structures. Electronics. 2023; 12(13):2891.
https://doi.org/10.3390/electronics12132891
Chicago/Turabian Style
Shu, Lei, Huai-Lin Liao, Zi-Yuan Wu, Yan-Yan Li, Xing-Yu Fang, Shi-Wei Liang, Tong-De Li, Liang Wang, Jun Wang, and Yuan-Fu Zhao.
2023. "Comparison of Gamma Irradiation Effects on Short Circuit Characteristics of SiC MOSFET Power Devices between Planar and Trench Structures" Electronics 12, no. 13: 2891.
https://doi.org/10.3390/electronics12132891
APA Style
Shu, L., Liao, H.-L., Wu, Z.-Y., Li, Y.-Y., Fang, X.-Y., Liang, S.-W., Li, T.-D., Wang, L., Wang, J., & Zhao, Y.-F.
(2023). Comparison of Gamma Irradiation Effects on Short Circuit Characteristics of SiC MOSFET Power Devices between Planar and Trench Structures. Electronics, 12(13), 2891.
https://doi.org/10.3390/electronics12132891
