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Journal: Electronics, 2023
Volume: 12
Number: 2426
Article:
Ti/HfO2-Based RRAM with Superior Thermal Stability Based on Self-Limited TiOx
Authors:
by
Huikai He, Yixin Tan, Choonghyun Lee and Yi Zhao
Link:
https://www.mdpi.com/2079-9292/12/11/2426
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