Order Article Reprints

Sun Y, Zheng J, Lyn L, Zhao H, Li J, Tan Y, Liu X, Li Y. The Same Name Is Not Always the Same: Correlating and Tracing Forgery Methods across Various Deepfake Datasets. Electronics. 2023; 12(11):2353. https://doi.org/10.3390/electronics12112353

Sun, Yi, Jun Zheng, Lingjuan Lyn, Hanyu Zhao, Jiaxing Li, Yunteng Tan, Xinyu Liu, and Yuanzhang Li. 2023. "The Same Name Is Not Always the Same: Correlating and Tracing Forgery Methods across Various Deepfake Datasets" Electronics 12, no. 11: 2353. https://doi.org/10.3390/electronics12112353

Sun, Y., Zheng, J., Lyn, L., Zhao, H., Li, J., Tan, Y., Liu, X., & Li, Y. (2023). The Same Name Is Not Always the Same: Correlating and Tracing Forgery Methods across Various Deepfake Datasets. Electronics, 12(11), 2353. https://doi.org/10.3390/electronics12112353