Order Article Reprints

Zhao L, Tang Y, Bai Y, Qiu M, Wu Z, Yang Y, Yang C, Tian X, Liu X. Analysis of Defects and Electrical Characteristics of Variable-Temperature Proton-Irradiated 4H-SiC JBS Diodes. Electronics. 2022; 11(9):1341. https://doi.org/10.3390/electronics11091341

Zhao, Liansheng, Yidan Tang, Yun Bai, Menglin Qiu, Zhikang Wu, Yu Yang, Chengyue Yang, Xiaoli Tian, and Xinyu Liu. 2022. "Analysis of Defects and Electrical Characteristics of Variable-Temperature Proton-Irradiated 4H-SiC JBS Diodes" Electronics 11, no. 9: 1341. https://doi.org/10.3390/electronics11091341

Zhao, L., Tang, Y., Bai, Y., Qiu, M., Wu, Z., Yang, Y., Yang, C., Tian, X., & Liu, X. (2022). Analysis of Defects and Electrical Characteristics of Variable-Temperature Proton-Irradiated 4H-SiC JBS Diodes. Electronics, 11(9), 1341. https://doi.org/10.3390/electronics11091341