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Journal: Electronics, 2022
Volume: 11
Number: 1336
Article:
GPR-Based Framework for Statistical Analysis of Gate Delay under NBTI and Process Variation Effects
Authors:
by
Aiguo Bu, Rongke Wang, Shuhao Jia and Jie Li
Link:
https://www.mdpi.com/2079-9292/11/9/1336
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