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Journal: Electronics, 2022
Volume: 11
Number: 802
Article:
Evaluation of the Long-Term Reliability of Open-Tube Diffused Planar InGaAs/InP Avalanche Photodiodes under a Hybrid of Thermal and Electrical Stresses
Authors:
by
Hyejeong Choi, Chan-Yong Park, Soo-Hyun Baek, Gap Yeal Moon and Ilgu Yun
Link:
https://www.mdpi.com/2079-9292/11/5/802
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