Choi, H.; Park, C.-Y.; Baek, S.-H.; Moon, G.Y.; Yun, I.
Evaluation of the Long-Term Reliability of Open-Tube Diffused Planar InGaAs/InP Avalanche Photodiodes under a Hybrid of Thermal and Electrical Stresses. Electronics 2022, 11, 802.
https://doi.org/10.3390/electronics11050802
AMA Style
Choi H, Park C-Y, Baek S-H, Moon GY, Yun I.
Evaluation of the Long-Term Reliability of Open-Tube Diffused Planar InGaAs/InP Avalanche Photodiodes under a Hybrid of Thermal and Electrical Stresses. Electronics. 2022; 11(5):802.
https://doi.org/10.3390/electronics11050802
Chicago/Turabian Style
Choi, Hyejeong, Chan-Yong Park, Soo-Hyun Baek, Gap Yeal Moon, and Ilgu Yun.
2022. "Evaluation of the Long-Term Reliability of Open-Tube Diffused Planar InGaAs/InP Avalanche Photodiodes under a Hybrid of Thermal and Electrical Stresses" Electronics 11, no. 5: 802.
https://doi.org/10.3390/electronics11050802
APA Style
Choi, H., Park, C.-Y., Baek, S.-H., Moon, G. Y., & Yun, I.
(2022). Evaluation of the Long-Term Reliability of Open-Tube Diffused Planar InGaAs/InP Avalanche Photodiodes under a Hybrid of Thermal and Electrical Stresses. Electronics, 11(5), 802.
https://doi.org/10.3390/electronics11050802