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Journal: Electronics, 2022
Volume: 11
Number: 3530

Article: EMC Impact of Disturbances Generated by Multiple Sources
Authors: by Hamidreza Karami, Marcos Rubinstein, Farhad Rachidi, Christophe Perrenoud, Emmanuel de Raemy, Pascal Kraehenbuehl and Arturo Mediano
Link: https://www.mdpi.com/2079-9292/11/21/3530

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