Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; Sonza Reorda, M.
An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells. Electronics 2022, 11, 203.
https://doi.org/10.3390/electronics11020203
AMA Style
Mirabella N, Grosso M, Franchino G, Rinaudo S, Deretzis I, La Magna A, Sonza Reorda M.
An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells. Electronics. 2022; 11(2):203.
https://doi.org/10.3390/electronics11020203
Chicago/Turabian Style
Mirabella, Nunzio, Michelangelo Grosso, Giovanna Franchino, Salvatore Rinaudo, Ioannis Deretzis, Antonino La Magna, and Matteo Sonza Reorda.
2022. "An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells" Electronics 11, no. 2: 203.
https://doi.org/10.3390/electronics11020203
APA Style
Mirabella, N., Grosso, M., Franchino, G., Rinaudo, S., Deretzis, I., La Magna, A., & Sonza Reorda, M.
(2022). An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells. Electronics, 11(2), 203.
https://doi.org/10.3390/electronics11020203
