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Journal: Electronics, 2022
Volume: 11
Number: 2465

Article: A Fully Polarity-Aware Double-Node-Upset-Resilient Latch Design
Authors: by Jung-Jin Park, Young-Min Kang, Geon-Hak Kim, Ik-Joon Chang and Jinsang Kim
Link: https://www.mdpi.com/2079-9292/11/15/2465

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