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Journal: Electronics, 2022
Volume: 11
Number: 1981

Article: The Fast Detection of Abnormal ETC Data Based on an Improved DTW Algorithm
Authors: by Feng Guo, Fumin Zou, Sijie Luo, Lyuchao Liao, Jinshan Wu, Xiang Yu and Cheng Zhang
Link: https://www.mdpi.com/2079-9292/11/13/1981

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