Article Versions Notes

Lin W, Wang M, Sun H, Xie B, Wen CP, Hao Y, Shen B. Suppressing Buffer-Induced Current Collapse in GaN HEMTs with a Source-Connected p-GaN (SCPG): A Simulation Study. Electronics. 2021; 10(8):942. https://doi.org/10.3390/electronics10080942

Lin, Wei, Maojun Wang, Haozhe Sun, Bing Xie, Cheng P. Wen, Yilong Hao, and Bo Shen. 2021. "Suppressing Buffer-Induced Current Collapse in GaN HEMTs with a Source-Connected p-GaN (SCPG): A Simulation Study" Electronics 10, no. 8: 942. https://doi.org/10.3390/electronics10080942

Lin, W., Wang, M., Sun, H., Xie, B., Wen, C. P., Hao, Y., & Shen, B. (2021). Suppressing Buffer-Induced Current Collapse in GaN HEMTs with a Source-Connected p-GaN (SCPG): A Simulation Study. Electronics, 10(8), 942. https://doi.org/10.3390/electronics10080942