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Journal: Electronics, 2021
Volume: 10
Number: 441
441
Article: Evaluation of V_TH and R_ON Drifts during Switch-Mode Operation in Packaged SiC MOSFETs
Authors: by Marcello Cioni, Alessandro Bertacchini, Alessandro Mucci, Nicolò Zagni, Giovanni Verzellesi, Paolo Pavan and Alessandro Chini
Link: https://www.mdpi.com/2079-9292/10/4/441

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