Cioni, M.; Bertacchini, A.; Mucci, A.; Zagni, N.; Verzellesi, G.; Pavan, P.; Chini, A.
Evaluation of VTH and RON Drifts during Switch-Mode Operation in Packaged SiC MOSFETs. Electronics 2021, 10, 441.
https://doi.org/10.3390/electronics10040441
AMA Style
Cioni M, Bertacchini A, Mucci A, Zagni N, Verzellesi G, Pavan P, Chini A.
Evaluation of VTH and RON Drifts during Switch-Mode Operation in Packaged SiC MOSFETs. Electronics. 2021; 10(4):441.
https://doi.org/10.3390/electronics10040441
Chicago/Turabian Style
Cioni, Marcello, Alessandro Bertacchini, Alessandro Mucci, Nicolò Zagni, Giovanni Verzellesi, Paolo Pavan, and Alessandro Chini.
2021. "Evaluation of VTH and RON Drifts during Switch-Mode Operation in Packaged SiC MOSFETs" Electronics 10, no. 4: 441.
https://doi.org/10.3390/electronics10040441
APA Style
Cioni, M., Bertacchini, A., Mucci, A., Zagni, N., Verzellesi, G., Pavan, P., & Chini, A.
(2021). Evaluation of VTH and RON Drifts during Switch-Mode Operation in Packaged SiC MOSFETs. Electronics, 10(4), 441.
https://doi.org/10.3390/electronics10040441