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Journal: Electronics, 2021
Volume: 10
Number: 2492
Article:
Technique for Profiling the Cycling-Induced Oxide Trapped Charge in NAND Flash Memories
Authors:
by
Yung-Yueh Chiu and Riichiro Shirota
Link:
https://www.mdpi.com/2079-9292/10/20/2492
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