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Journal: Electronics, 2021
Volume: 10
Number: 2095
Article:
Practical Challenges of High-Power IGBT’s I-V Curve Measurement and Its Importance in Reliability Analysis
Authors:
by
Omid Alavi, Leander Van Cappellen, Ward De Ceuninck and Michaël Daenen
Link:
https://www.mdpi.com/2079-9292/10/17/2095
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