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Journal: Electronics, 2021
Volume: 10
Number: 1828

Article: Gate All around with Back Gate NAND Flash Structure for Excellent Reliability Characteristics in Program Operation
Authors: by Jae-Min Sim, Bong-Seok Kim, In-Ho Nam and Yun-Heub Song
Link: https://www.mdpi.com/2079-9292/10/15/1828

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