Chavan, A.; Palakurthi, P.; MacDonald, E.; Neff, J.; Bozeman, E.
Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179.
https://doi.org/10.3390/jlpea2020168
AMA Style
Chavan A, Palakurthi P, MacDonald E, Neff J, Bozeman E.
Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. Journal of Low Power Electronics and Applications. 2012; 2(2):168-179.
https://doi.org/10.3390/jlpea2020168
Chicago/Turabian Style
Chavan, Ameet, Praveen Palakurthi, Eric MacDonald, Joseph Neff, and Eric Bozeman.
2012. "Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation" Journal of Low Power Electronics and Applications 2, no. 2: 168-179.
https://doi.org/10.3390/jlpea2020168
APA Style
Chavan, A., Palakurthi, P., MacDonald, E., Neff, J., & Bozeman, E.
(2012). Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. Journal of Low Power Electronics and Applications, 2(2), 168-179.
https://doi.org/10.3390/jlpea2020168