Hu, X.; Xu, H.; Haunschild, R.; Liu, C.; Tan, X.
Research on Risk Measurement Methods of Scientific and Technological Innovation: A Dynamic Tension Model Based on Novelty and Adaptation. Systems 2026, 14, 142.
https://doi.org/10.3390/systems14020142
AMA Style
Hu X, Xu H, Haunschild R, Liu C, Tan X.
Research on Risk Measurement Methods of Scientific and Technological Innovation: A Dynamic Tension Model Based on Novelty and Adaptation. Systems. 2026; 14(2):142.
https://doi.org/10.3390/systems14020142
Chicago/Turabian Style
Hu, Xiaoyang, Haiyun Xu, Robin Haunschild, Chunjiang Liu, and Xiao Tan.
2026. "Research on Risk Measurement Methods of Scientific and Technological Innovation: A Dynamic Tension Model Based on Novelty and Adaptation" Systems 14, no. 2: 142.
https://doi.org/10.3390/systems14020142
APA Style
Hu, X., Xu, H., Haunschild, R., Liu, C., & Tan, X.
(2026). Research on Risk Measurement Methods of Scientific and Technological Innovation: A Dynamic Tension Model Based on Novelty and Adaptation. Systems, 14(2), 142.
https://doi.org/10.3390/systems14020142