De Beer, B.; Vandenhole, M.; Njiru, C.; Spanoghe, P.; Dermauw, W.; Van Leeuwen, T.
High-Resolution Genetic Mapping Combined with Transcriptome Profiling Reveals That Both Target-Site Resistance and Increased Detoxification Confer Resistance to the Pyrethroid Bifenthrin in the Spider Mite Tetranychus urticae. Biology 2022, 11, 1630.
https://doi.org/10.3390/biology11111630
AMA Style
De Beer B, Vandenhole M, Njiru C, Spanoghe P, Dermauw W, Van Leeuwen T.
High-Resolution Genetic Mapping Combined with Transcriptome Profiling Reveals That Both Target-Site Resistance and Increased Detoxification Confer Resistance to the Pyrethroid Bifenthrin in the Spider Mite Tetranychus urticae. Biology. 2022; 11(11):1630.
https://doi.org/10.3390/biology11111630
Chicago/Turabian Style
De Beer, Berdien, Marilou Vandenhole, Christine Njiru, Pieter Spanoghe, Wannes Dermauw, and Thomas Van Leeuwen.
2022. "High-Resolution Genetic Mapping Combined with Transcriptome Profiling Reveals That Both Target-Site Resistance and Increased Detoxification Confer Resistance to the Pyrethroid Bifenthrin in the Spider Mite Tetranychus urticae" Biology 11, no. 11: 1630.
https://doi.org/10.3390/biology11111630
APA Style
De Beer, B., Vandenhole, M., Njiru, C., Spanoghe, P., Dermauw, W., & Van Leeuwen, T.
(2022). High-Resolution Genetic Mapping Combined with Transcriptome Profiling Reveals That Both Target-Site Resistance and Increased Detoxification Confer Resistance to the Pyrethroid Bifenthrin in the Spider Mite Tetranychus urticae. Biology, 11(11), 1630.
https://doi.org/10.3390/biology11111630