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Journal: Coatings, 2019
Volume: 9
Number: 720
Article:
Leakage Current Conduction Mechanism of Au-Pt-Ti/ HfO2-Al2O3/n-InAlAs Metal-Oxide-Semiconductor Capacitor under Reverse-Biased Condition
Authors:
by
He Guan and Shaoxi Wang
Link:
https://www.mdpi.com/2079-6412/9/11/720
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