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Conductive Characteristics of Indium Tin Oxide Thin Film on Polymeric Substrate under Long-Term Static Deformation

Department of Mechanical Engineering, National Central University, Jhong-Li District, Tao-Yuan 32001, Taiwan
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Coatings 2018, 8(6), 212; https://doi.org/10.3390/coatings8060212
Received: 17 April 2018 / Revised: 25 May 2018 / Accepted: 29 May 2018 / Published: 1 June 2018
The objective of this study is to investigate the effect of long-term static bending on the conductive characteristics of indium tin oxide (ITO) thin film in flexible optoelectronics. Two types of substrate are considered, namely ITO on polyethylene naphthalate (ITO/PEN) and ITO on polyethylene terephthalate (ITO/PET). Electrical properties of the ITO/PEN and ITO/PET sheets are measured in situ under static bending at various radii of curvature. Experimental results indicate that no significant change in electrical resistance of the ITO/PEN and ITO/PET sheets is found for compressive bending after 1000 h at a curvature radius of 10 mm or larger. However, the ITO/PEN and ITO/PET sheets are seriously damaged under a tensile bending of 10 mm radius and 5 mm radius, respectively. The given ITO/PET sheet exhibits a greater resistance to long-term mechanical bending than the ITO/PEN one, which is attributed to the effect of stiffness and thickness of substrate. As the given PET substrate has a lower stiffness and thickness than the PEN one, ITO thin film in the ITO/PET sheet has a smaller stress given a bending radius. Consequently, a smaller extent of change in the electrical conductance of ITO thin film is found in the ITO/PET sheet. View Full-Text
Keywords: indium tin oxide; electrical conductance; static bending; polyethylene terephthalate; polyethylene naphthalate indium tin oxide; electrical conductance; static bending; polyethylene terephthalate; polyethylene naphthalate
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Tran, D.-P.; Lu, H.-I.; Lin, C.-K. Conductive Characteristics of Indium Tin Oxide Thin Film on Polymeric Substrate under Long-Term Static Deformation. Coatings 2018, 8, 212.

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