Wilbrandt, S.; Stenzel, O.; Liaf, A.; Munzert, P.; Schwinde, S.; Stempfhuber, S.; Felde, N.; Trost, M.; Seifert, T.; Schröder, S.
Spectrophotometric Characterization of Thin Semi-Transparent Aluminum Films Prepared by Electron Beam Evaporation and Magnetron Sputtering. Coatings 2022, 12, 1278.
https://doi.org/10.3390/coatings12091278
AMA Style
Wilbrandt S, Stenzel O, Liaf A, Munzert P, Schwinde S, Stempfhuber S, Felde N, Trost M, Seifert T, Schröder S.
Spectrophotometric Characterization of Thin Semi-Transparent Aluminum Films Prepared by Electron Beam Evaporation and Magnetron Sputtering. Coatings. 2022; 12(9):1278.
https://doi.org/10.3390/coatings12091278
Chicago/Turabian Style
Wilbrandt, Steffen, Olaf Stenzel, Abrar Liaf, Peter Munzert, Stefan Schwinde, Sven Stempfhuber, Nadja Felde, Marcus Trost, Tina Seifert, and Sven Schröder.
2022. "Spectrophotometric Characterization of Thin Semi-Transparent Aluminum Films Prepared by Electron Beam Evaporation and Magnetron Sputtering" Coatings 12, no. 9: 1278.
https://doi.org/10.3390/coatings12091278
APA Style
Wilbrandt, S., Stenzel, O., Liaf, A., Munzert, P., Schwinde, S., Stempfhuber, S., Felde, N., Trost, M., Seifert, T., & Schröder, S.
(2022). Spectrophotometric Characterization of Thin Semi-Transparent Aluminum Films Prepared by Electron Beam Evaporation and Magnetron Sputtering. Coatings, 12(9), 1278.
https://doi.org/10.3390/coatings12091278