Depth Profile Analysis of the Modified Layer of Poly(vinyltrimethylsilane) Films Treated by Direct-Current Discharge
Abstract
:1. Introduction
2. Materials and Methods
3. Results
3.1. XPS of Initial PVTMS Surface
3.2. The Etching Rate
3.3. XPS of PVTMS Surface Treated by DC Discharge
4. Discussion
5. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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Piskarev, M.; Skryleva, E.; Gilman, A.; Senatulin, B.; Zinoviev, A.; Syrtsova, D.; Teplyakov, V.; Kuznetsov, A. Depth Profile Analysis of the Modified Layer of Poly(vinyltrimethylsilane) Films Treated by Direct-Current Discharge. Coatings 2021, 11, 1317. https://doi.org/10.3390/coatings11111317
Piskarev M, Skryleva E, Gilman A, Senatulin B, Zinoviev A, Syrtsova D, Teplyakov V, Kuznetsov A. Depth Profile Analysis of the Modified Layer of Poly(vinyltrimethylsilane) Films Treated by Direct-Current Discharge. Coatings. 2021; 11(11):1317. https://doi.org/10.3390/coatings11111317
Chicago/Turabian StylePiskarev, Mikhail, Elena Skryleva, Alla Gilman, Boris Senatulin, Alexander Zinoviev, Daria Syrtsova, Vladimir Teplyakov, and Alexander Kuznetsov. 2021. "Depth Profile Analysis of the Modified Layer of Poly(vinyltrimethylsilane) Films Treated by Direct-Current Discharge" Coatings 11, no. 11: 1317. https://doi.org/10.3390/coatings11111317