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Journal: Coatings, 2020
Volume: 10
Number: 236
Article:
Investigation for Sidewall Roughness Caused Optical Scattering Loss of Silicon-on-Insulator Waveguides with Confocal Laser Scanning Microscopy
Authors:
by
Hongpeng Shang, Degui Sun, Peng Yu, Bin Wang, Ting Yu, Tiancheng Li and Huilin Jiang
Link:
https://www.mdpi.com/2079-6412/10/3/236
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