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Journal: Nanomaterials, 2019
Volume: 9
Number: 1634
1634
Article: Heteroepitaxial Growth of High-Quality and Crack-Free AlN Film on Sapphire Substrate with Nanometer-Scale-Thick AlN Nucleation Layer for AlGaN-Based Deep Ultraviolet Light-Emitting Diodes
Authors: by Jie Zhao, Hongpo Hu, Yu Lei, Hui Wan, Liyan Gong and Shengjun Zhou
Link: https://www.mdpi.com/2079-4991/9/11/1634

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