Liu, Q.; Chen, Y.; Zhou, Q.; Jiang, J.; Luo, F.; Wu, F.; Guo, C.; Zhu, Z.; Chen, D.
Nanosphere Self-Assembly Imaging Systems and Defect Detection Algorithms for Self-Assembled Structures: A Review. Nanomaterials 2026, 16, 890.
https://doi.org/10.3390/nano16140890
AMA Style
Liu Q, Chen Y, Zhou Q, Jiang J, Luo F, Wu F, Guo C, Zhu Z, Chen D.
Nanosphere Self-Assembly Imaging Systems and Defect Detection Algorithms for Self-Assembled Structures: A Review. Nanomaterials. 2026; 16(14):890.
https://doi.org/10.3390/nano16140890
Chicago/Turabian Style
Liu, Qihang, Yuang Chen, Qingwei Zhou, Jinbao Jiang, Fang Luo, Fan Wu, Chucai Guo, Zhihong Zhu, and Dan Chen.
2026. "Nanosphere Self-Assembly Imaging Systems and Defect Detection Algorithms for Self-Assembled Structures: A Review" Nanomaterials 16, no. 14: 890.
https://doi.org/10.3390/nano16140890
APA Style
Liu, Q., Chen, Y., Zhou, Q., Jiang, J., Luo, F., Wu, F., Guo, C., Zhu, Z., & Chen, D.
(2026). Nanosphere Self-Assembly Imaging Systems and Defect Detection Algorithms for Self-Assembled Structures: A Review. Nanomaterials, 16(14), 890.
https://doi.org/10.3390/nano16140890