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Journal: Nanomaterials, 2025
Volume: 15
Number: 460
460
Article: Enhancement in Performance and Reliability of Fully Transparent a-IGZO Top-Gate Thin-Film Transistors by a Two-Step Annealing Treatment
Authors: by Shuaiying Zheng, Chengyuan Wang, Shaocong Lv, Liwei Dong, Zhijun Li, Qian Xin, Aimin Song, Jiawei Zhang and Yuxiang Li
Link: https://www.mdpi.com/2079-4991/15/6/460

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