Article Versions Notes

Li D, Peng X, Ye Z, Cao H, Wang B, Zhao X, Shi F. Deep Learning-Assisted Microscopic Polarization Inspection of Micro-Nano Damage Precursors: Automatic, Non-Destructive Metrology for Additive Manufacturing Devices. Nanomaterials. 2025; 15(11):821. https://doi.org/10.3390/nano15110821

Li, Dingkang, Xing Peng, Zhenfeng Ye, Hongbing Cao, Bo Wang, Xinjie Zhao, and Feng Shi. 2025. "Deep Learning-Assisted Microscopic Polarization Inspection of Micro-Nano Damage Precursors: Automatic, Non-Destructive Metrology for Additive Manufacturing Devices" Nanomaterials 15, no. 11: 821. https://doi.org/10.3390/nano15110821

Li, D., Peng, X., Ye, Z., Cao, H., Wang, B., Zhao, X., & Shi, F. (2025). Deep Learning-Assisted Microscopic Polarization Inspection of Micro-Nano Damage Precursors: Automatic, Non-Destructive Metrology for Additive Manufacturing Devices. Nanomaterials, 15(11), 821. https://doi.org/10.3390/nano15110821