Yang, X.; Wang, L.; Smaluk, V.; Shaftan, T.; Wang, T.; Bouet, N.; D’Amen, G.; Wan, W.; Musumeci, P.
Simulation Study of High-Precision Characterization of MeV Electron Interactions for Advanced Nano-Imaging of Thick Biological Samples and Microchips. Nanomaterials 2024, 14, 1797.
https://doi.org/10.3390/nano14221797
AMA Style
Yang X, Wang L, Smaluk V, Shaftan T, Wang T, Bouet N, D’Amen G, Wan W, Musumeci P.
Simulation Study of High-Precision Characterization of MeV Electron Interactions for Advanced Nano-Imaging of Thick Biological Samples and Microchips. Nanomaterials. 2024; 14(22):1797.
https://doi.org/10.3390/nano14221797
Chicago/Turabian Style
Yang, Xi, Liguo Wang, Victor Smaluk, Timur Shaftan, Tianyi Wang, Nathalie Bouet, Gabriele D’Amen, Weishi Wan, and Pietro Musumeci.
2024. "Simulation Study of High-Precision Characterization of MeV Electron Interactions for Advanced Nano-Imaging of Thick Biological Samples and Microchips" Nanomaterials 14, no. 22: 1797.
https://doi.org/10.3390/nano14221797
APA Style
Yang, X., Wang, L., Smaluk, V., Shaftan, T., Wang, T., Bouet, N., D’Amen, G., Wan, W., & Musumeci, P.
(2024). Simulation Study of High-Precision Characterization of MeV Electron Interactions for Advanced Nano-Imaging of Thick Biological Samples and Microchips. Nanomaterials, 14(22), 1797.
https://doi.org/10.3390/nano14221797
