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Journal: Nanomaterials, 2023
Volume: 13
Number: 1451

Article: Investigation of Program Efficiency Overshoot in 3D Vertical Channel NAND Flash with Randomly Distributed Traps
Authors: by Chanyang Park, Jun-Sik Yoon, Kihoon Nam, Hyundong Jang, Minsang Park and Rock-Hyun Baek
Link: https://www.mdpi.com/2079-4991/13/9/1451

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