Manard, B.T.; Bradley, V.C.; Quarles, C.D., Jr.; Hendriks, L.; Dunlap, D.R.; Hexel, C.R.; Sullivan, P.; Andrews, H.B.
Towards Automated and High-Throughput Quantitative Sizing and Isotopic Analysis of Nanoparticles via Single Particle-ICP-TOF-MS. Nanomaterials 2023, 13, 1322.
https://doi.org/10.3390/nano13081322
AMA Style
Manard BT, Bradley VC, Quarles CD Jr., Hendriks L, Dunlap DR, Hexel CR, Sullivan P, Andrews HB.
Towards Automated and High-Throughput Quantitative Sizing and Isotopic Analysis of Nanoparticles via Single Particle-ICP-TOF-MS. Nanomaterials. 2023; 13(8):1322.
https://doi.org/10.3390/nano13081322
Chicago/Turabian Style
Manard, Benjamin T., Veronica C. Bradley, C. Derrick Quarles, Jr., Lyndsey Hendriks, Daniel R. Dunlap, Cole R. Hexel, Patrick Sullivan, and Hunter B. Andrews.
2023. "Towards Automated and High-Throughput Quantitative Sizing and Isotopic Analysis of Nanoparticles via Single Particle-ICP-TOF-MS" Nanomaterials 13, no. 8: 1322.
https://doi.org/10.3390/nano13081322
APA Style
Manard, B. T., Bradley, V. C., Quarles, C. D., Jr., Hendriks, L., Dunlap, D. R., Hexel, C. R., Sullivan, P., & Andrews, H. B.
(2023). Towards Automated and High-Throughput Quantitative Sizing and Isotopic Analysis of Nanoparticles via Single Particle-ICP-TOF-MS. Nanomaterials, 13(8), 1322.
https://doi.org/10.3390/nano13081322