Ferraro, A.; Bruno, M.D.L.; Papuzzo, G.; Varchera, R.; Forestiero, A.; De Santo, M.P.; Caputo, R.; Barberi, R.C.
Low Cost and Easy Validation Anticounterfeiting Plasmonic Tags Based on Thin Films of Metal and Dielectric. Nanomaterials 2022, 12, 1279.
https://doi.org/10.3390/nano12081279
AMA Style
Ferraro A, Bruno MDL, Papuzzo G, Varchera R, Forestiero A, De Santo MP, Caputo R, Barberi RC.
Low Cost and Easy Validation Anticounterfeiting Plasmonic Tags Based on Thin Films of Metal and Dielectric. Nanomaterials. 2022; 12(8):1279.
https://doi.org/10.3390/nano12081279
Chicago/Turabian Style
Ferraro, Antonio, Mauro Daniel Luigi Bruno, Giuseppe Papuzzo, Rosa Varchera, Agostino Forestiero, Maria Penolope De Santo, Roberto Caputo, and Riccardo Cristofaro Barberi.
2022. "Low Cost and Easy Validation Anticounterfeiting Plasmonic Tags Based on Thin Films of Metal and Dielectric" Nanomaterials 12, no. 8: 1279.
https://doi.org/10.3390/nano12081279
APA Style
Ferraro, A., Bruno, M. D. L., Papuzzo, G., Varchera, R., Forestiero, A., De Santo, M. P., Caputo, R., & Barberi, R. C.
(2022). Low Cost and Easy Validation Anticounterfeiting Plasmonic Tags Based on Thin Films of Metal and Dielectric. Nanomaterials, 12(8), 1279.
https://doi.org/10.3390/nano12081279